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請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/17318
標題: A 65 nm CMOS Statistical Frequency Ratio Calculator for Frequency Measurement
作者: Lu, Yun-Chih
Wu, Chi-Hung 
Chen, Yi-Jan Emery
關鍵字: CMOS;frequency measurement;frequency ratio;process;voltage;and temperature (PVT) resistant;statistical circuits
公開日期: 1-四月-2021
出版社: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
卷: 68
期: 4
起(迄)頁: 3558-3566
來源出版物: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
摘要: 
In this article, the frequency ratio calculator (FRC) based on the statistical algorithm is proposed to obtain the integer and fractional frequency ratios of an input signal and a reference signal. The function of FRC can be used for fast frequency measurement of an unknown signal. Thanks to the proposed statistical algorithm, the circuit implementation of the FRC can be realized by synthesis of CMOS standard cell library and its performance is resistant to the variation of process, voltage, and temperature. The FRC is developed in a commercial 65 nm CMOS technology and its input signal frequency range is from 300 MHz to 1.5 GHz. The ratio calculation time takes only two reference cycles and the ratio accuracy is better than 0.003. The FRC consumes 12-42 mW of power from a 1.2 V supply voltage for different input frequency.
URI: http://scholars.ntou.edu.tw/handle/123456789/17318
ISSN: 0278-0046
DOI: 10.1109/TIE.2020.2977536
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