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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/22826
DC FieldValueLanguage
dc.contributor.authorChiao-Yun Changen_US
dc.contributor.authorHeng Lien_US
dc.contributor.authorYang-Ta Shihen_US
dc.contributor.authorTien-Chang Luen_US
dc.date.accessioned2022-10-31T00:47:26Z-
dc.date.available2022-10-31T00:47:26Z-
dc.date.issued2015-03-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/22826-
dc.description.abstractWe systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.publisherAIP Publishingen_US
dc.relation.ispartofAPPLIED PHYSICS LETTERSen_US
dc.subjectGANen_US
dc.titleManipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wellsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1063/1.4914116-
dc.identifier.isi000351069900004-
dc.relation.journalvolume106en_US
dc.relation.journalissue9en_US
dc.identifier.eissn1077-3118en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:電機工程學系
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