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請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/22826
標題: Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells
作者: Chiao-Yun Chang 
Heng Li
Yang-Ta Shih
Tien-Chang Lu
關鍵字: GAN
公開日期: 三月-2015
出版社: AIP Publishing
卷: 106
期: 9
來源出版物: APPLIED PHYSICS LETTERS
摘要: 
We systematically investigated the influence of nanoscale V-pits on the internal quantum efficiency (IQE) of InGaN multiple quantum wells (MQWs) by adjusting the underlying superlattices (SLS). The analysis indicated that high barrier energy of sidewall MQWs on V-pits and long diffusion distance between the threading dislocation (TD) center and V-pit boundary were crucial to effectively passivate the non-radiative centers of TDs. For a larger V-pit, the thicker sidewall MQW on V-pit would decrease the barrier energy. On the contrary, a shorter distance between the TD center and V-pit boundary would be observed in a smaller V-pit, which could increase the carrier capturing capability of TDs. An optimized V-pit size of approximately 200-250 nm in our experiment could be concluded for MQWs with 15 pairs SLS, which exhibited an IQE value of 70%. (C) 2015 AIP Publishing LLC.
URI: http://scholars.ntou.edu.tw/handle/123456789/22826
ISSN: 0003-6951
DOI: 10.1063/1.4914116
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