http://scholars.ntou.edu.tw/handle/123456789/22989| Title: | Electrical and optoelectronic characterization of a ZnO nanowire contacted by focused-ion-beam-deposited Pt | Authors: | JH He PH Chang Cheng-Ying Chen KT Tsai |
Issue Date: | Apr-2009 | Publisher: | IOP Publishing | Journal Volume: | 20 | Journal Issue: | 13 | Start page/Pages: | 135701 | Source: | NANOTECHNOLOGY | Abstract: | We report on the transport properties of a single ZnO nanowire (NW) measured as a function of the length/square of the radius ratio via the transmission line method (TLM). The specific contact resistance of FIB-Pt contacts to the ZnO NWs is determined to be as low as 1.1 × 10−5 Ω cm2. The resistivity of the ZnO NWs is measured to be 2.2 × 10−2 Ω cm. ZnO NW-based UV photodetectors contacted by FIB-Pt with a photoconductive gain as high as ∼108 have been fabricated and characterized. |
URI: | http://scholars.ntou.edu.tw/handle/123456789/22989 | ISSN: | 0957-4484 | DOI: | 10.1088/0957-4484/20/13/135701 |
| Appears in Collections: | 光電與材料科技學系 |
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