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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/22996
Title: Single-ZnO-Nanowire Memory
Authors: Yen-De Chiang
Wen-Yuan Chang
Ching-Yuan Ho
Cheng-Ying Chen 
Chih-Hsiang Ho
Su-Jien Lin
Tai-Bor Wu
Hau He
Keywords: OHMIC CONTACTS;HIGH-SPEED;NONVOLATILE;RESISTANCE
Issue Date: Jun-2011
Publisher: IEEE
Journal Volume: 58
Journal Issue: 6
Start page/Pages: 1735-1740
Source: Electron Devices, IEEE Transactions on
Abstract: 
Single-ZnO-nanowire (NW) memory based on resistive switching is demonstrated for the first time. The NW memory is stable, rewritable, and nonvolatile with on/off ratio up to 7.7 × 10 5 . The O vacancies at the surfaces of ZnO NWs and around the interface of Ti/ZnO NWs observed using X-ray phototelectron spectroscopy, transmission electron microscopy (TEM), selected-area electron diffraction, and high-resolution TEM might play a role in the resistive switching behavior. The endurance of resistive switching can be enhanced by further increasing the sweeping voltage. This paper brings an exciting possibility of building next-generation memory devices based on NWs.
URI: http://scholars.ntou.edu.tw/handle/123456789/22996
ISSN: 0018-9383
DOI: 10.1109/TED.2011.2121914
Appears in Collections:光電與材料科技學系

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