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  2. 電機資訊學院
  3. 光電與材料科技學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/23019
Title: Growth and Structural Characterization of SiGe Nanorings
Authors: JH He
Cheng-Ying Chen 
CH Ho
CW Wang
MJ Chen
LJ Chen
Keywords: MOLECULAR-BEAM EPITAXY;QUANTUM RINGS;THIN-FILMS;FABRICATION;LITHOGRAPHY;NANOWIRE;ARRAYS;HETEROSTRUCTURES;TEMPLATES;SILICON
Issue Date: Mar-2010
Publisher: American Chemical Society
Journal Volume: 114
Journal Issue: 13
Start page/Pages: 5727-5731
Source: JOURNAL OF PHYSICAL CHEMISTRY C
Abstract: 
Self-assembled single-crystalline Si(1-x)Ge(x) nanorings (NRs), as small as 10 nm with narrow distributions of height and diameter, have been fabricated without any specific equipment. Compared to other approaches for nanofabricating the ring-like structures, the smallest Si(1-x)Ge(x) NRs with the highest density were obtained by the mediation of Au nanodots. The process promises the availability of Si(1-x)Ge(x) NRs with a wide range of Ge concentration and size, and can serve as a useful platform for the fundamental understanding and future practical applications of NR devices.
URI: http://scholars.ntou.edu.tw/handle/123456789/23019
ISSN: 1932-7447
DOI: 10.1021/jp9081382
Appears in Collections:光電與材料科技學系

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