Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/23703
標題: Improved fatigue strength of Cr-electroplated 7075-T6 Al alloy by micro-shot peening
作者: Su, Chih-Hang
Chen, Tai-Cheng
Tsay, Leu-Wen 
關鍵字: 7075 Al alloy;Electroplated Cr;Micro -shot peening;Fatigue strength;Residual stress
公開日期: 1-二月-2023
出版社: ELSEVIER SCI LTD
卷: 167
來源出版物: INTERNATIONAL JOURNAL OF FATIGUE
摘要: 
The effects of micro-shot peening (MSP) on the rotating bending fatigue resistance of Cr-electroplated AA 7075-T6 Al alloy were investigated. Fe-based amorphous particles with sizes of 50-80 mu m were used as the shot balls and peened under 100 % surface coverage. The shot-peen intensity, determined by the height of the N-type Almen specimen, was 0.110 mm. The Cr-electroplated layer consisted of a network of microcracks in the as -plated condition. Without the necessity of micro-crack initiation, the Cr-electroplated substrate had the short-est fatigue life and lowest fatigue strength among the tested samples. MSP significantly increased the fatigue strength/life of 7075-T6 Al alloy with or without Cr-plating. The introduction of high residual compressive stress combined with the formation of a nanograined structure in the MSP zone was responsible for the high resistance to fatigue crack growth of the MSP sample.
URI: http://scholars.ntou.edu.tw/handle/123456789/23703
ISSN: 0142-1123
DOI: 10.1016/j.ijfatigue.2022.107354
顯示於:光電與材料科技學系

顯示文件完整紀錄

WEB OF SCIENCETM
Citations

2
上周
1
上個月
checked on 2023/6/27

Page view(s)

134
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋