Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/23729
標題: Effects of Micro-Shot Peening on the Stress Corrosion Cracking of Austenitic Stainless Steel Welds
作者: Kang, Chia-Ying
Chen, Tai-Cheng
Tsay, Leu-Wen 
關鍵字: stainless steel weld;micro-shot peening;stress corrosion cracking;residual stress;nanograined structure
公開日期: 1-一月-2023
出版社: MDPI
卷: 13
期: 1
來源出版物: METALS
摘要: 
Micro-shot peening on AISI 304 and 316 stainless steel (SS) laser welds was performed to evaluate its effect on the susceptibility to stress corrosion cracking (SCC) in a salt spray containing 10% NaCl at 80 degrees C. The cracking susceptibility of the welds was disclosed by testing U-bend specimens in a salt spray. Micro-shot peening caused an intense but narrow deformed layer with a nanocrystal structure and residual compressive stress. Austenite to martensite transformation occurred heavily on the top surface of the micro-shot peened welds. SCC microcracks were more likely to be initiated at the fusion boundary (FB) of the non-peened welds. However, fine pits were formed more easily on the micro-shot peened 304 fusion zone (FZ), which was attributed to the extensive formation of strain-induced martensite. The nanograined structure and induced residual compressive stress in the micro-shot peened layer suppressed microcrack initiation in the 304 and 316 welds in a salt spray. Compared with the other zones in the welds in a salt spray, the high local strain at the FB was the cause of the high cracking susceptibility and could be mitigated by the micro-shot peening treatment.
URI: http://scholars.ntou.edu.tw/handle/123456789/23729
DOI: 10.3390/met13010069
顯示於:光電與材料科技學系

顯示文件完整紀錄

WEB OF SCIENCETM
Citations

2
checked on 2023/6/27

Page view(s)

98
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋