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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/24066
Title: Characteristics of Polarization Emission in a-plane GaN-based Multiple Quantum Wells Structures
Authors: Chiao-Yun Chang 
Huei-Min Huang
Tien-Chang Lu
Hao-Chung Kuo
Shing-Chung Wang
Chih Ming Lai
Keywords: Gallium nitride;Optical polarization;Aluminum gallium nitride;Quantum well devices;Stimulated emission;Educational institutions;Physics
Issue Date: Apr-2012
Publisher: IEEE
Journal Volume: 48
Journal Issue: 7
Start page/Pages: 867-871
Source: IEEE Journal of Quantum Electronics
Abstract: 
In this paper, we investigated polarized light emission properties on a series of $a$ -plane GaN/AlGaN multiple quantum wells grown on $r$-plane sapphire substrates with various well widths by using the polarization-dependent photoluminescence measurement. To clarify reasons of polarization properties in light emission, we applied the 6 $\,\times\,$6 $k\cdot p$ model to simulate the $E{\hbox{--}}K$ dispersion relationship and wave functions to obtain optical transitions of different polarized emissions. According to our results, the sub-bands of $\vert {\rm Y}>$-like states are raised toward the top of the valence sub-band level with increasing the well width. And the optical matrix element of $y$-polarized light emission will dominate the optical transition, leading to the increase of degree of polarization in the thicker well.
URI: http://scholars.ntou.edu.tw/handle/123456789/24066
DOI: 10.1109/JQE.2012.2191140
Appears in Collections:電機工程學系

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