An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/2871

Title:	An image-temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm
Authors:	Chiang, Y. C. Jinn-Tong Chiu Chang, Z. J. Chang, D. Y.
Issue Date:	Sep-2017
Journal Volume:	231
Journal Issue:	18
Source:	Proceedings of the Institution of Mechanical Engineers Part C-Journal of Mechanical Engineering Science
URI:	http://scholars.ntou.edu.tw/handle/123456789/2871
ISSN:	0954-4062
DOI:	10.1177/0954406216645131 ://WOS:000411900900012
Appears in Collections:	系統工程暨造船學系

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