Temperature dependent surface photovoltage spectroscopy characterization of highly strained InGaAs/GaAs double quantum well structures grown by metal organic vapor phase epitaxy

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8014

Title:	Temperature dependent surface photovoltage spectroscopy characterization of highly strained InGaAs/GaAs double quantum well structures grown by metal organic vapor phase epitaxy
Authors:	Chan, C. H. Wu, J. D. Huang, Y. S. Su, Y. K. Kwong-Kau Tiong
Issue Date:	Aug-2009
Journal Volume:	106
Journal Issue:	4
Source:	Journal of Applied Physics
URI:	http://scholars.ntou.edu.tw/handle/123456789/8014
ISSN:	0021-8979
DOI:	10.1063/1.3208053 ://WOS:000270083800038
Appears in Collections:	電機工程學系

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