Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8092

Title:	Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate
Authors:	Hsu, H. P. Yang, P. H. Huang, J. K. Wu, P. H. Huang, Y. S. Li, C. Huang, S. H. Kwong-Kau Tiong
Issue Date:	2013
Journal Volume:	2013
Source:	Advances in Condensed Matter Physics
URI:	http://scholars.ntou.edu.tw/handle/123456789/8092
ISSN:	1687-8108
DOI:	10.1155/2013/298190 ://WOS:000327328900001
Appears in Collections:	電機工程學系

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