http://scholars.ntou.edu.tw/handle/123456789/8515| Title: | Integrated two Hopfield neural networks for automatic LED defect inspection | Authors: | Chang, C. Y. Chang, C. W. Lin, S. Y. Mu-Der Jeng |
Issue Date: | Feb-2008 | Journal Volume: | 29 | Journal Issue: | 1 | Source: | Journal of the Chinese Society of Mechanical Engineers | URI: | http://scholars.ntou.edu.tw/handle/123456789/8515 | ISSN: | 0257-9731 | DOI: |
| Appears in Collections: | 電機工程學系 |
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