http://scholars.ntou.edu.tw/handle/123456789/8517| Title: | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Authors: | Chang, C. Y. Li, C. H. Chang, J. W. Mu-Der Jeng |
Issue Date: | Jan-2009 | Journal Volume: | 36 | Journal Issue: | 1 | Source: | Expert Systems with Applications | URI: | http://scholars.ntou.edu.tw/handle/123456789/8517 | ISSN: | 0957-4174 | DOI: | 10.1016/j.eswa.2007.10.033 |
| Appears in Collections: | 電機工程學系 |
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