Deep traps and mechanism of brightness degradation in Mn-doped ZnS thin-film electroluminescent devices grown by metal-organic chemical vapor deposition

請用此 Handle URI 來引用此文件： http://scholars.ntou.edu.tw/handle/123456789/10405

標題:	Deep traps and mechanism of brightness degradation in Mn-doped ZnS thin-film electroluminescent devices grown by metal-organic chemical vapor deposition
作者:	Wang, C. W. Terng-Ji Sheu Su, Y. K. Yokoyama, M.
公開日期:	五月-1997
卷:	36
期:	5A
來源出版物:	Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
URI:	http://scholars.ntou.edu.tw/handle/123456789/10405
ISSN:	0021-4922
DOI:	10.1143/jjap.36.2728 ://WOS:A1997XG01400034
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