MEASUREMENTS OF MICROWAVE DIELECTRIC PROPERTIES OF (1-X)TIO2-XCATIO(3) AND (1-X)TIO2-XSRTIO3 THIN FILMS BY THE CAVITY PERTURBATION METHOD

請用此 Handle URI 來引用此文件： http://scholars.ntou.edu.tw/handle/123456789/3154

標題:	MEASUREMENTS OF MICROWAVE DIELECTRIC PROPERTIES OF (1-X)TIO2-XCATIO(3) AND (1-X)TIO2-XSRTIO3 THIN FILMS BY THE CAVITY PERTURBATION METHOD
作者:	Jyh-Jong Sheen Li, C. Y. Lin, S. W.
公開日期:	2011
卷:	25
期:	13
來源出版物:	Journal of Electromagnetic Waves and Applications
URI:	http://scholars.ntou.edu.tw/handle/123456789/3154
ISSN:	0920-5071
DOI:	10.1163/156939311797453962 ://WOS:000295871400012
顯示於：	機械與機電工程學系

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