http://scholars.ntou.edu.tw/handle/123456789/4548| Title: | In-TFT-Array-Process Micro Defect Inspection Using Nonlinear Principal Component Analysis | Authors: | Liu, Y. H. Wang, C. K. Ting, Y. Lin, W. Z. Kang, Z. H. Chen, C. S. Jih-Shang Hwang |
Issue Date: | Oct-2009 | Journal Volume: | 10 | Journal Issue: | 10 | Source: | International Journal of Molecular Sciences | URI: | http://scholars.ntou.edu.tw/handle/123456789/4548 | DOI: | 10.3390/ijms10104498 |
| Appears in Collections: | 光電與材料科技學系 |
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