http://scholars.ntou.edu.tw/handle/123456789/8545
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Mu-Der Jeng | en_US |
dc.contributor.author | Xie, X. L. | en_US |
dc.contributor.author | Chung, S. L. | en_US |
dc.date.accessioned | 2020-11-20T11:06:24Z | - |
dc.date.available | 2020-11-20T11:06:24Z | - |
dc.date.issued | 2004-01 | - |
dc.identifier.issn | 1083-4427 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/8545 | - |
dc.relation.ispartof | Ieee Transactions on Systems Man and Cybernetics Part a-Systems and Humans | en_US |
dc.title | ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1109/tsmca.2003.820579 | - |
dc.identifier.doi | <Go to ISI>://WOS:000188209300009 | - |
dc.identifier.url | <Go to ISI>://WOS:000188209300009 | |
dc.relation.journalvolume | 34 | en_US |
dc.relation.journalissue | 1 | en_US |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Electrical Engineering | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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