http://scholars.ntou.edu.tw/handle/123456789/8545| Title: | ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems | Authors: | Mu-Der Jeng Xie, X. L. Chung, S. L. |
Issue Date: | Jan-2004 | Journal Volume: | 34 | Journal Issue: | 1 | Source: | Ieee Transactions on Systems Man and Cybernetics Part a-Systems and Humans | URI: | http://scholars.ntou.edu.tw/handle/123456789/8545 | ISSN: | 1083-4427 | DOI: | 10.1109/tsmca.2003.820579 |
| Appears in Collections: | 電機工程學系 |
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