http://scholars.ntou.edu.tw/handle/123456789/8759| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hsu, M. K. | en_US |
| dc.contributor.author | Chen, H. R. | en_US |
| dc.contributor.author | Chiou, S. Y. | en_US |
| dc.contributor.author | Chen, W. T. | en_US |
| dc.contributor.author | Chen, G. H. | en_US |
| dc.contributor.author | Chang, Y. C. | en_US |
| dc.contributor.author | Wen-Shiung Lour | en_US |
| dc.date.accessioned | 2020-11-20T11:28:24Z | - |
| dc.date.available | 2020-11-20T11:28:24Z | - |
| dc.date.issued | 2006-07 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/8759 | - |
| dc.relation.ispartof | Applied Physics Letters | en_US |
| dc.title | Gate-metal formation-related kink effect and gate current on In0.5Al0.5As/In0.5Ga0.5As metamorphic high electron mobility transistor performance | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1063/1.2222259 | - |
| dc.identifier.doi | <Go to ISI>://WOS:000239174100115 | - |
| dc.identifier.url | <Go to ISI>://WOS:000239174100115 | |
| dc.relation.journalvolume | 89 | en_US |
| dc.relation.journalissue | 3 | en_US |
| item.grantfulltext | none | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.cerifentitytype | Publications | - |
| item.fulltext | no fulltext | - |
| item.openairetype | journal article | - |
| crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
| crisitem.author.dept | Department of Electrical Engineering | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 電機工程學系 | |
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