http://scholars.ntou.edu.tw/handle/123456789/8759| Title: | Gate-metal formation-related kink effect and gate current on In0.5Al0.5As/In0.5Ga0.5As metamorphic high electron mobility transistor performance | Authors: | Hsu, M. K. Chen, H. R. Chiou, S. Y. Chen, W. T. Chen, G. H. Chang, Y. C. Wen-Shiung Lour |
Issue Date: | Jul-2006 | Journal Volume: | 89 | Journal Issue: | 3 | Source: | Applied Physics Letters | URI: | http://scholars.ntou.edu.tw/handle/123456789/8759 | ISSN: | 0003-6951 | DOI: | 10.1063/1.2222259 |
| Appears in Collections: | 電機工程學系 |
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