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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/10405
Title: Deep traps and mechanism of brightness degradation in Mn-doped ZnS thin-film electroluminescent devices grown by metal-organic chemical vapor deposition
Authors: Wang, C. W.
Terng-Ji Sheu 
Su, Y. K.
Yokoyama, M.
Issue Date: May-1997
Journal Volume: 36
Journal Issue: 5A
Source: Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
URI: http://scholars.ntou.edu.tw/handle/123456789/10405
ISSN: 0021-4922
DOI: 10.1143/jjap.36.2728
://WOS:A1997XG01400034
Appears in Collections:師資培育中心

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