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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/1989
Title: Refractive index behavior of boron-doped silica films by plasma-enhanced chemical vapor deposition
Authors: Horng, R. H.
Chen, F.
Wuu, D. S.
Tai-Yuan Lin 
Issue Date: Feb-1996
Journal Volume: 92
Source: Applied Surface Science
URI: http://scholars.ntou.edu.tw/handle/123456789/1989
ISSN: 0169-4332
DOI: 10.1016/0169-4332(95)00261-8
://WOS:A1996UG56100069
Appears in Collections:光電與材料科技學系

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