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Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/23628
Title: Temperature dependence of sensing properties of hydrogen-sensitive extended-base heterojunction transistors
Authors: Huang, Chia Hua
Tan, Shih Wei 
Lo, Hao
Lo, Chieh
Lour, Wen Shiung
Keywords: Hydrogen sensor;InGaP-GaAs;Bipolar transistor;Metal-semiconductor;Current gain
Issue Date: 29-Nov-2022
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Journal Volume: 47
Journal Issue: 92
Start page/Pages: 39276-39287
Source: INTERNATIONAL JOURNAL OF HYDROGEN ENERGY
Abstract: 
A planar-type metal-semiconductor-metal (MSM) hydrogen sensor forming on the collector layer was employed as an extended base (EB) of the InGaP-GaAs heterojunction bipolar transistors (HBTs). Then, hydrogen sensing transistors integrated were proposed and studied. After introducing sensing properties of the EB-hydrogen sensor, various sensing current gains defined were addressed for our hydrogen sensing transistor. Instead of the base current, N2 and/or hydrogen-containing gases were used as a parameter while measuring common-emitter characteristics of the hydrogen sensing transistor at various temperatures. Experimental results show that maximum sensing base current gains in 1% H2/N2 is 330 at 25 degrees C while it is enhanced to 1800 at 50 degrees C, then to 2300 at 80 degrees C, and finally to 2800 at 110 degrees C. In contrast, a peak sensing collector current gain is as high as 1.2 x 105 (4.3 x 104) in 1% (0.01%) at 110 degrees C. In addition, response times obtained from the sensing diode (base) and collector currents in 0.01% H2/N2 are 485 (490) and 745 s at 25 degrees C. Together with important features including one power supply and low-power consumption, the proposed hydrogen sensing transistor is very promising for applications in detecting hydrogen. (c) 2022 Hydrogen Energy Publications LLC. Published by Elsevier Ltd. All rights reserved.
URI: http://scholars.ntou.edu.tw/handle/123456789/23628
ISSN: 0360-3199
DOI: 10.1016/j.ijhydene.2022.09.082
Appears in Collections:電機工程學系

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