Characterization of sputtered iridium dioxide thin films

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8139

標題:	Characterization of sputtered iridium dioxide thin films
作者:	Liao, P. C. Ho, W. S. Huang, Y. S. Kwong-Kau Tiong
公開日期:	五月-1998
卷:	13
期:	5
來源出版物:	Journal of Materials Research
URI:	http://scholars.ntou.edu.tw/handle/123456789/8139
ISSN:	0884-2914
DOI:	10.1557/jmr.1998.0187 ://WOS:000073272500038
Appears in Collections:	電機工程學系

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