Characterization of Ge/Si0.16Ge0.84 multiple quantum wells on Ge-on-Si virtual substrate using piezoreflectance spectroscopy

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8177

Title:	Characterization of Ge/Si0.16Ge0.84 multiple quantum wells on Ge-on-Si virtual substrate using piezoreflectance spectroscopy
Authors:	Wu, P. H. Huang, Y. S. Hsu, H. P. Li, C. Huang, S. H. Kwong-Kau Tiong
Issue Date:	Aug-2013
Journal Volume:	167
Source:	Solid State Communications
URI:	http://scholars.ntou.edu.tw/handle/123456789/8177
ISSN:	0038-1098
DOI:	10.1016/j.ssc.2013.04.035 ://WOS:000323298600002
Appears in Collections:	電機工程學系

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