LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/8516

Title:	LEARNING VECTOR QUANTIZATION NEURAL NETWORKS FOR LED WAFER DEFECT INSPECTION
Authors:	Chang, C. Y. Li, C. H. Chang, C. H. Mu-Der Jeng
Issue Date:	Oct-2008
Journal Volume:	4
Journal Issue:	10
Source:	International Journal of Innovative Computing Information and Control
URI:	http://scholars.ntou.edu.tw/handle/123456789/8516
ISSN:	1349-4198
DOI:	://WOS:000260104100012
Appears in Collections:	電機工程學系

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