http://scholars.ntou.edu.tw/handle/123456789/3153
Title: | Measurements of dielectric properties of TiO2 thin films at microwave frequencies using an extended cavity perturbation technique | Authors: | Jyh-Jong Sheen Li, C. Y. Ji, L. W. Mao, W. L. Liu, W. H. Chen, C. A. |
Issue Date: | Aug-2010 | Journal Volume: | 21 | Journal Issue: | 8 | Source: | Journal of Materials Science-Materials in Electronics | URI: | http://scholars.ntou.edu.tw/handle/123456789/3153 | ISSN: | 0957-4522 | DOI: | 10.1007/s10854-009-9999-8 |
Appears in Collections: | 機械與機電工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.