Effects of Non-Stoichiometry on the Microstructure, Oxygen Vacancies, and Electrical Properties of KNN-Based Thin Films

請用此 Handle URI 來引用此文件： http://scholars.ntou.edu.tw/handle/123456789/3158

標題:	Effects of Non-Stoichiometry on the Microstructure, Oxygen Vacancies, and Electrical Properties of KNN-Based Thin Films
作者:	Weng, C. M. Tsai, C. C. Hong, C. S. Lin, C. C. Chen, C. C. Chu, S. Y. Jyh-Jong Sheen Chen, Z. Y. Su, H. H.
公開日期:	2016
卷:	5
期:	9
來源出版物:	Ecs Journal of Solid State Science and Technology
URI:	http://scholars.ntou.edu.tw/handle/123456789/3158
ISSN:	2162-8769
DOI:	10.1149/2.0291609jss ://WOS:000387983000005
顯示於：	機械與機電工程學系

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